Temperature measurement method
AssigneeAsahi Kasei Microdevices Corporation
InventorsMasashi Higashino, Yuta Takagi
Life of this patent
Estimating the term…
Abstract
Provided is a temperature measurement method including: a step in which a contactless type temperature measurement unit of a temperature measurement device measures a temperature of a measurement target to acquire contactless measurement data; a step of determining a time point at which the temperature measurement device contacts the measurement target; and a step of calculating the temperature of the measurement target based on the contactless measurement data during a predetermined time window for temperature calculation before or until the time point determined as the time point at which the temperature measurement device contacts the measurement target.
Claims17
A temperature measurement method, comprising:
- a step of measuring, by a contactless type temperature measurement unit of a temperature measurement device, a temperature of a measurement target to acquire contactless measurement data;
- a step of determining a time point at which the temperature measurement device contacts the measurement target;
- and
- a step of calculating the temperature of the measurement target based on the contactless measurement data during a predetermined time window for temperature calculation before or until a time point determined as the time point at which the temperature measurement device contacts the measurement target.
Dependencies are inferred from the claim text.