Shape measurement device and shape measurement method
AssigneeHitachi High-Tech Corporation
InventorsKenji MARUNO, Masahiro WATANABE, Tatsuo HARIYAMA, Hirohito AKIYAMA, Hidehiko KANDO
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AssigneeHitachi High-Tech Corporation
InventorsKenji MARUNO, Masahiro WATANABE, Tatsuo HARIYAMA, Hirohito AKIYAMA, Hidehiko KANDO
Estimating the term…
The shape of an object is measured with high accuracy by a probe having a measurement light optical path switching element including a first surface on which the measurement light from an optical element is incident, a second surface that reflects the measurement light incident from the first surface, a third surface that emits the measurement light reflected by the second surface to an object, a fourth surface that is in contact with the second surface, and a fifth surface that emits the measurement light having passed through the second surface to the object. An angle between a normal of the second surface and a rotation axis of the probe is greater than 45 degrees, an angle between a normal of the third surface and the rotation axis is less than 90 degrees, and a normal of the fifth surface is not parallel to the rotation axis.
A shape measurement device comprising:
A shape measurement method using a shape measurement device including a calculation unit and a measurement head, wherein
Dependencies are inferred from the claim text.