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AssigneeInstitute of Geology and Geophysics, Chinese Academy of Sciences
InventorsJialong HAO, Wei YANG, Sen HU, Hengci TIAN, Yangting LIN
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The disclosure discloses a nano-ion probe frozen sample table in the field of nano-ion probes, including a frozen sample assembly including a frozen sample holder and a frozen sample rack arranged on one face of the frozen sample holder; a normal-temperature sample assembly including a normal-temperature sample holder and a normal-temperature sample rack arranged on one face of the normal-temperature sample holder; and a base platform, two sides of one face of the base platform are respectively connected to the frozen sample holder and the normal-temperature sample holder; another face of the base platform is connected to a sample table; the base platform is in an ion sputtering chamber, one side of the ion sputtering chamber is connected to a flange, the flange internally houses a refrigeration assembly. The refrigeration assembly transfers low temperature to the frozen sample holder to freeze the sample to a solid state.
A nano-ion probe freezing sample table, comprising:
Dependencies are inferred from the claim text.