Emi value testing method for lpddr chip, and system, device, and storage medium thereof

Abstract

This disclosure discloses an EMI value testing method, a system, a device, and a storage medium for an LPDDR chip. The method comprises: obtaining a first storage capacity of the LPDDR chip; obtaining a second storage capacity of the LPDDR chip; comparing the first and second storage capacity with a preset storage capacity respectively to obtain a first comparison result; acquiring a first EMI value and a second EMI value based on the first comparison result, a first storage table, and a second storage table; and determining the EMI value of the LPDDR chip based on the first and second EMI values. By comprehensively and specifically detecting the storage capacity of two Ranks in the entire LPDDR chip and obtaining corresponding first and second EMI values based on the storage capacity, the EMI value of the LPDDR chip can be accurately tested.

Dependencies are inferred from the claim text.