Voltage adjustment based on memory device temperature profiling

A computer-implemented method comprising:

• measuring a program temperature associated with a virtual block (VB);
• measuring a read temperature associated with the VB;
• determining, based at least in part on the measured program temperature and the measured read temperature, a cross-temperature condition;
• and
• based on the determined cross-temperature condition, determining an adjusted voltage, the adjusted voltage including one or more of:
• an adjusted pass through voltage (Vpassr), an adjusted bit line (BL) bias voltage, or an adjusted source line (SL) voltage.

Non-transitory computer readable media having instructions stored thereon, that when executed by at least one processor, cause the at least one processor to:

• measure a program temperature associated with a virtual block (VB);
• measure a read temperature associated with the VB;
• determine, based at least in part on the measured program temperature and the measured read temperature, a cross-temperature condition;
• and
• based on the determined cross-temperature condition, determine an adjusted voltage, the adjusted voltage including one or more of:
• an adjusted pass through voltage (Vpassr), an adjusted bit line (BL) bias voltage, or an adjusted source line (SL) voltage.