Method of scanning an area with a multi-photon laser scanning microscope comprising at least one laser source and a focusing lens system defining an optical Z axis, an optical beam path is provided between the at least one laser source and the focusing lens system, the microscope further comprising first and second acousto-optical deflectors arranged in the optical beam path for deflecting a laser beam exiting the focusing lens system in an X-Z plane defined by the optical Z axis and an X axis perpendicular to the optical Z axis, and third and fourth acousto-optical deflectors arranged in the optical beam path for deflecting the laser beam exiting the focusing lens system in an Y-Z plane defined by the optical Z axis and an Y axis perpendicular to the optical Z axis and the X axis, characterised by scanning a disk lying in a plane perpendicular to an X-Y plane defined by the X axis and the Y axis by guiding the laser beam along the optical beam path from the laser source to the focusing lens system while providing frequency drive signal functions ƒX1(t), ƒX2(t), ƒY1(t), ƒY2(t) to the first, second, third and fourth acousto-optical deflectors defined as
- f
- X
-
- 1
- (
- t
- )
- =
- f
- 0
-
- X
-
- 1
- (
- t
- )
- +
- Δ
-
- f
- X
-
- 1
- (
- t
- )
- f
- X
-
- 2
- (
- t
- )
- =
- f
- 0
-
- X
-
- 2
- (
- t
- )
- +
- Δ
-
- f
- X
-
- 2
- (
- t
- )
- f
- Y
-
- 1
- (
- t
- )
- =
- f
- 0
-
- Y
-
- 1
- (
- t
- )
- +
- Δ
-
- f
- Y
-
- 1
- (
- t
- )
- f
- Y
-
- 2
- (
- t
- )
- =
- f
- 0
-
- Y
-
- 2
- (
- t
- )
- +
- Δ
-
- f
- Y
-
- 2
- (
- t
- )
- respectively, wherein ƒ0X1(t), ƒ0X2(t), ƒ0Y1(t), ƒ0Y2(t) are frequency drive signal terms for focusing the laser beam in random access point scanning mode to a centre of the disk, the centre having coordinates x, y, z, and ΔƒX1(t), ΔƒX2(t), ΔƒY1(t), ΔƒY2(t) are frequency drive signal terms determining a periphery of the disc and being defined as
- Δ
-
- f
- X
-
- 1
- (
- t
- )
- =
- s
- X
-
- 1
- ·
- f
- ampX
- ·
- cos
-
- (
- 2
-
- π
- T
-
- t
- +
- φ
- )
- ,
- Δ
-
- f
- X
-
- 2
- (
- t
- )
- =
- s
- X
-
- 2
- ·
- f
- ampX
- ·
- cos
-
- (
- 2
-
- π
- T
-
- t
- +
- φ
- )
- ,
- Δ
-
- f
- Y
-
- 1
- (
- t
- )
- =
- s
- Y
-
- 1
- ·
- f
- ampX
- ·
- sin
-
- (
- 2
-
- π
- T
-
- t
- +
- φ
- )
- ,
- Δ
-
- f
- Y
-
- 2
- (
- t
- )
- =
- s
- Y
-
- 2
- ·
- f
- ampY
- ·
- sin
-
- (
- 2
-
- π
- T
-
- t
- +
- φ
- )
- ,
- wherein sX1, sX2, sY1, sY2 are selected from values +1 and −1, ƒampX is a first multiplying factor determining a first radius RX of the disc along the X axis, ƒampY is a second multiplying factor determining a second radius RY of the disc along the Y axis, φ is an arbitrary phase shift, and T is a time period required for scanning the disc, and selecting a value of the period T such as to fall between 0.25·Tacc and 1.6·Tacc, wherein Tacc is a filling time of the deflectors.