Device for determining optical properties of an optically transparent substrate, and coating system
AssigneeBüHler Alzenau GmbH
InventorRalf SPERLING
Life of this patent
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Abstract
A device for determining optical properties of an optically transparent substrate which is provided with a substrate coating on a first side has a first operating mode and a second operating mode, wherein, in the first operating mode, a first emission unit is active and a second emission unit is inactive and, in the second operating mode, the first emission unit is inactive and the second emission unit is active, so that electromagnetic radiation reflected and transmitted in the operating modes can be detected by means of a first detector unit and, respectively, a second detector unit. Further indicated is a coating system.
Claims15
A device for determining optical properties of an optically transparent substrate which is provided with a substrate coating on a first side,
- wherein the device comprises a first measuring unit and a second measuring unit, the first measuring unit being assigned to the first side of the substrate and the second measuring unit being assigned to a second side of the substrate opposite to the first side,
- wherein the first measuring unit comprises a first emission unit for irradiating a measuring area of the substrate with directed electromagnetic radiation and a first detector unit
- wherein the second measuring unit comprises at least a second emission unit for irradiating the measuring area of the substrate with directed electromagnetic radiation and at least a second detector unit,
- wherein the device has a first operating mode and a second operating mode, wherein, in the first operating mode, the first emission unit is active and the second emission unit is inactive and, in the second operating mode, the first emission unit is inactive and the second emission unit is active, so that
- in the first operating mode, the electromagnetic radiation reflected by the substrate coating in the measuring area can be detected in the first detector unit and the electromagnetic radiation transmitted by the substrate in the measuring area can be detected in the second detector unit, and
- in the second operating mode, the electromagnetic radiation reflected by the substrate in the measuring area can be detected in the second detector unit.
A coating system for manufacturing an optically transparent substrate having a substrate coating applied to a first side of the substrate, comprising a device for determining optical properties of the optically transparent substrate according to claim
Dependencies are inferred from the claim text.