Apparatus and method for detecting and/or analyzing particles
AssigneeK|Lens GmbH
InventorsArchana GUPTA, Tobias ELLINGHAUS, Kireeti BODDUNA, Sunil JAISWAL, Simone FILOMENA, Klaus ILLGNER-FEHNS
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AssigneeK|Lens GmbH
InventorsArchana GUPTA, Tobias ELLINGHAUS, Kireeti BODDUNA, Sunil JAISWAL, Simone FILOMENA, Klaus ILLGNER-FEHNS
Estimating the term…
An apparatus a method and a computer program product for detecting and/or analyzing particles, which apparatus includes a sample chamber within which the particles are to be detected, and a light source emitting light into the sample chamber. The apparatus includes an imaging system configured for capturing an imaging region provided for imaging light from the light source that is deflected by the particles, and a device for evaluating a recording of the imaging region created by the imaging system. The sample chamber is expediently formed within a container, which preferably contains a medium, in particular a liquid. The imaging region is formed by a wall of the container, the wall preferably being at least partially light-transmissive, preferably transparent or translucent.
1-25. (canceled)
An apparatus for detecting and/or analyzing particles, comprising:
A method for detecting and/or analyzing particles that are arranged in a sample space, comprising the steps of:
A computer program product for detecting and/or analyzing particles, which is configured to ascertain whether there are particles in a sample space, and/or to determine properties of the particles, automatically from a recording of an imaging region that is compiled by an imaging system, in which imaging region light from a light source that is deviated by the particles is imaged.
Dependencies are inferred from the claim text.