Three-dimensional measuring apparatus
AssigneeDenso Wave Incorporated
InventorsMakito INOUE, Yusuke MITANI, Masataka TSUJIMOTO
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AssigneeDenso Wave Incorporated
InventorsMakito INOUE, Yusuke MITANI, Masataka TSUJIMOTO
Estimating the term…
An apparatus includes a projection unit projecting a fringe pattern on a region, an imaging unit capturing an object disposed in the region, and a measuring unit measuring a three-dimensional shape of the captured object. The fringe pattern includes a plurality of fringe regions that are disposed along a first direction, and each of the plurality of fringe regions changes in luminance in the first direction at a predetermined ratio and does not change in luminance in a second direction orthogonal to the first direction. The imaging unit outputs event data that identifies a position of a pixel subjected to a luminance change when light is received. The measuring unit measures the three-dimensional shape of the object by a light section method based on positions of a plurality of pixels identified from pieces of the event data output in an identical time slot within unit time for capturing.
A three-dimensional measuring apparatus comprising:
Dependencies are inferred from the claim text.