Measuring apparatus and measuring system
AssigneeSuntory Holdings Limited
InventorsJunki Yamamura, Satoshi Nakamaru, Koutarou Tajima
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AssigneeSuntory Holdings Limited
InventorsJunki Yamamura, Satoshi Nakamaru, Koutarou Tajima
Estimating the term…
In order to solve the conventional problem that it is sometimes difficult to properly perform required measurement of detection target items of target objects that are uneven or target objects with low stiffness, a measuring apparatus 1 includes a sensor array unit 5 having multiple sensors 51 that are aligned on a placement face and that are each capable of detecting a detection target item of a target object that is positioned so as to oppose the placement face, and a deformable layer 10 that is a flexible layer disposed between the sensor array unit 5 and a target object. The deformable layer 10 has multiple sections that are divided from each other so as to be independently compressible and deformable mainly in a normal direction of the placement face. With the measuring apparatus 1, it is possible to obtain measurement results of a detection target item of a target object such that the influence of the stiffness and the shape of the target object is relatively small.
A measuring apparatus comprising:
A measuring system comprising a measuring apparatus, and a processing unit that acquires a measurement result using a detection result of the measuring apparatus,
Dependencies are inferred from the claim text.