Single crystal diamond
AssigneeElement Six Technologies Limited
InventorTeodoro GRAZIOSI
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Abstract
A method of measuring detectable features indicative of strain arising from subsurface damage below a surface of single crystal diamond having an area of at least 1 mm2 is described. The method comprising using any of Raman microscopy to highlight a peak shift indicative of strain; and fluorescence imaging to highlight features associated with defects.
Claims8
A method of measuring detectable features indicative of strain arising from subsurface damage below a surface of single crystal diamond having an area of at least 1 mm2, the method comprising using any of Raman microscopy to highlight a peak shift indicative of strain;
- and fluorescence imaging to highlight features associated with defects.
A method of manufacturing a composite single crystal diamond, the method comprising:
- providing a single crystal diamond substrate having an area of at least 1 mm2;
- measuring detectable features indicative of strain arising from subsurface damage below a surface of the single crystal diamond substrate diamond, the measuring comprising using any of Raman microscopy to highlight a peak shift indicative of strain;
- and fluorescence imaging to highlight features associated with defects;
- homoepitaxially overgrowing a second layer of CVD single crystal diamond on the single crystal diamond substrate thereby forming a composite single crystal diamond comprising two layers in which the single crystal diamond substrate forms the first layer.
Dependencies are inferred from the claim text.