Method and apparatus for telemetry of system on a wafer
AssigneeTesla, Inc.
InventorsBenjamin Floering, Kamran Hasan, Adam Nasr
Life of this patent
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Abstract
The present disclosure relates to systems and methods for monitoring a computing resource of a computing system. The computing resource may include a plurality of system on wafers (SoWs) that each includes an array of dies. The monitoring is based on receiving telemetry data from a die included in a SoW of the computing resource. An example computing system includes a SoW, a microcontroller communicatively coupled with SoW and that receives telemetry data associated with at least one of the dies, and a controller configured to obtain data from the microcontroller, determine the performance of the die of the SoW, and in response to determining that the performance is degraded, apply a corrective action.
Claims23
A computing system comprising:
- an array of dies included on a system on a wafer (SoW), wherein the dies of the array are configured to output telemetry data;
- a microcontroller configured to receive telemetry data associated with at least one die of the array of dies;
- and
- a controller configured to obtain data that comprises the telemetry data from the microcontroller, determine a performance metric of a particular die of the array of dies by processing the obtained data, and apply a corrective action in response to determining that the performance metric satisfies a threshold.
A method of monitoring a computing system, the method comprising:
- obtaining telemetry data from the computing system, wherein the computing system comprises a plurality of system on a wafers (SoWs), and wherein each SoW of the plurality of SoWs comprises an array of dies;
- and
- determining a performance metric of individual dies of at least one SoW of the plurality of SoWs by processing the obtained telemetry data.
A method of providing a visualization of a performance metric of dies of a system on a wafer (SoW), the method comprising:
- obtaining telemetry data from dies of the SoW, wherein the SoW comprises an array of dies;
- determining the performance metric for each of the dies of the SoW based on processing the telemetry data;
- and
- providing a graphical representation of the performance metric of each of the dies of the SoW based on the determined performance metric.
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Dependencies are inferred from the claim text.