Radiation-sensitive composition and method for forming resist pattern
AssigneeJsr Corporation
InventorsTakuya OMIYA, Ryo ITO, Atsushi NAKAGAWA, Yuushi MATSUMURA, Katsuaki NISHIKORI
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AssigneeJsr Corporation
InventorsTakuya OMIYA, Ryo ITO, Atsushi NAKAGAWA, Yuushi MATSUMURA, Katsuaki NISHIKORI
Estimating the term…
A radiation-sensitive composition contains: (A) a polymer having a structural unit represented by formula (1) and; and (B) an onium salt compound which is formed of an organic anion and a cation, in which the organic anion or the cation or both have an iodo group, and which generates an acid through exposure to radiation. In the formula, B1 represents a single bond or a C≥1 divalent organic group bound to E+ at a carbon atom thereof. E+ represents a divalent group having an ammonium cation structure or a phosphonium cation structure. B2 represents a C≥1 divalent organic group bound to E+ and D− at the same carbon atom of different carbon atoms thereof. D− represents a monovalent group having an anion structure.
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