Resist and Process for Dry Positive Tone Electron Beam Lithography
AssigneeCalifornia Institute of Technology
InventorsAxel Scherer, Richard D. Smith
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AssigneeCalifornia Institute of Technology
InventorsAxel Scherer, Richard D. Smith
Estimating the term…
A method for lithographically patterning a substrate with a particle beam is fully compatible with a vacuum environment and positive tone development. The process includes physical vapor-depositing a resist layer comprising an organic material, such as myo-inositol, onto the substrate. The resist layer is then subjected to electron beam exposure to define a pattern. Subsequently, the exposed resist layer is thermally developed by heating the layer to an intermediate temperature, causing the exposed regions to be removed via evaporation while leaving the unexposed regions intact. This dry development process, which can optionally occur simultaneously with exposure, enables high-resolution pattern transfer and allows the entire lithography sequence to be performed without breaking vacuum, thereby reducing contamination and increasing microfabrication throughput.
A process for lithographically patterning a substrate in a positive polarity, the process comprising:
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A process for lithographically patterning a substrate in a positive polarity, the process comprising:
A process for lithographically patterning a substrate in a positive polarity, the process comprising:
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Dependencies are inferred from the claim text.