# US 2026/0210844 A1 · Spectrum measurement system

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- Number: US 2026/0210844 A1
- Document ID: US20260210844A1
- Status: Published application
- Kind: A1
- Application number: 19/028,040
- Filed: 2025-01-17
- Published: 2026-07-23
- Earliest claimed: 2025-01-17
- Assignees: Livestrong Optoelectronics Co., Ltd.
- Applicants: Livestrong Optoelectronics Co., Ltd.
- Inventors: Tzu-Huan CHENG
- Web page: https://patentgrep.com/patent/US20260210844A1

## CPC

- G01N 21/31: Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry {(G01N21/72 takes precedence)}
- G01J 3/00: Spectrometry; Spectrophotometry; Monochromators; Measuring colours
- G01J 3/0208: {using focussing or collimating elements, e.g. lenses or mirrors; performing aberration correction}
- G01J 3/021: {using plane or convex mirrors, parallel phase plates, or particular reflectors}
- G01J 3/0218: {using optical fibers}
- G01J 3/2823: {Imaging spectrometer}
- G01J 3/42: Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry (beam switching arrangements G01J3/08)
- G01J 3/44: Raman spectrometry; Scattering spectrometry {; Fluorescence spectrometry}
- G01N 21/55: Specular reflectivity
- G01N 21/65: Raman scattering
- G01N 21/9501: {Semiconductor wafers (manufacturing processes per se of semiconductor devices implementing a measuring step H10P74/20)}
- G01N 2021/3155: {Measuring in two spectral ranges, e.g. UV and visible}
- G01N 2021/558: {Measuring reflectivity and transmission}
- G01N 2021/6417: {Spectrofluorimetric devices}
- G01N 2201/103: Scanning by mechanical motion of stage
- G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q)
- G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N)

## Abstract

A spectrum measurement system for detecting a sample including a light source of broad wavelength and a spectrometer is disclosed. The light source of broad wavelength is adapted to provide a light with a wide wavelength range to irradiate the sample and generate a reflected light and a transmitted light on the sample. The spectrometer is adapted to receive spectral signals of the reflected light and the transmitted light of the sample at the same time, and directly calculate an absorption spectrum for the sample.

## Claims

### Claim 1

A spectrum measurement system for detecting a sample, comprising:
a light source of broad wavelength, adapted to provide a light with a wide wavelength range to irradiate the sample and generate a reflected light and a transmitted light on the sample; and
a spectrometer adapted to receive spectral signals of the reflected light and the transmitted light of the sample at the same time, and directly calculate an absorption spectrum of the sample.

### Claim 2 (depends on 1)

The spectrum measurement system of claim 1, wherein the wavelength of the light source is between 190 nm and 5000 nm.

### Claim 3 (depends on 1)

The spectrum measurement system of claim 1, wherein the spectrometer includes a high-resolution and is capable of analyzing optical signals from the ultraviolet to the near infrared, with a wavelength range from 190 nm to 5000 nm.

### Claim 4

A spectrum measurement system for measuring a sample, including:
a light source of broad wavelength adapted to provide light with a wide wavelength range to irradiate the sample and generate a reflected light and a transmitted light on the sample;
a first focusing optical module adapted to focus the light from the light source or to focus the reflected light;
a second focusing optical module adapted to focus the transmitted light;
a first optical switch module adapted to control an opening and closing of transmission of the reflected light;
a second optical switch module adapted to control an opening and closing of the transmission of the transmitted light; and
a spectrometer adapted to receive and analyze the spectral signal of the reflected light and/or the transmitted light.

### Claim 5 (depends on 4)

The spectrum measurement system of claim 4, wherein the first focusing optical module and the second focusing optical module include a high numerical aperture microscopic objective lens.

### Claim 6 (depends on 4)

The spectrum measurement system of claim 4, wherein the wavelength of the light source is between 190 nm and 5000 nm.

### Claim 7 (depends on 6)

The spectrum measurement system of claim 6, wherein the first optical switch module and the second optical switch module are selectively turned on or off to measure the reflected light, or the transmitted light, or to measure both the reflected light and the transmitted light simultaneously.

### Claim 8 (depends on 7)

The spectrum measurement system of claim 7, wherein the spectrometer includes a high-resolution and is capable of analyzing optical signals from the ultraviolet to the near infrared, with a wavelength range from 190 nm to 5000 nm.

### Claim 9 (depends on 7)

The spectrum measurement system of claim 7, wherein the spectrum measurement system further comprises a two-dimensional scanning platform mechanism adapted to scan and measure a specific area of the sample.

### Claim 10 (depends on 7)

The spectrum measurement system of claim 7, wherein the spectrum measurement system further comprises an image capture module to observe position of light spots on the sample.

### Claim 11 (depends on 7)

The spectrum measurement system of claim 7, wherein the spectrum measurement system further comprises Raman Spectroscopy and/or Fluorescence Spectroscopy.