Measurement circuit and semiconductor integrated circuit

A measurement circuit comprising:

• a first field effect transistor and a first bipolar transistor that are coupled between a first power supply line and a second power supply line via a first node;
• a second field effect transistor and a second bipolar transistor that are coupled between the first power supply line and the second power supply line via a second node;
• an analog-to-digital conversion circuit configured to:
• convert an analog voltage indicating a difference between a voltage at a first differential input node and a voltage at a second differential input node into a digital output value, by using a voltage at the first node as a reference voltage, and
• output the digital output value;
• and
• a first switch circuit provided between:
• an input side node including a voltage measurement node to which a voltage to be measured is supplied, the first node, and the second node, and
• an output side node including the first differential input node and the second differential input node, the first switch circuit being configured to switch a connection between the input side node and the output side node in accordance with a plurality of measurement modes for measuring a plurality of types of physical quantities, the plurality of measurement modes including a first measurement mode and a second measurement mode.