A mass spectrometer and a method for analyzing a sample therein
AssigneeTeledyne FLIR Defense, Inc.
InventorDALTON SNYDER
Life of this patent
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Abstract
Mass spectrometers and methods for analyzing a sample using a mass spectrometer are provided. The method includes applying a scan function to the ion trap including exciting at least a portion of the ions in the ion trap electively over time to fragment precursor ions into product ions and ejecting at least one of the product ions and the precursor ions from the ion trap. The mass spectrometer includes an ion trap and a controller configured to apply a scan function to the ion trap.
Claims22
A method for analyzing a sample in a mass spectrometer, the method comprising:
- storing ions produced from the sample in an ion trap of the mass spectrometer;
- and
- applying a scan function to the ion trap comprising
- exciting at least a portion of the ions in the ion trap selectively over time to fragment precursor ions into product ions, and
- ejecting at least one of the product ions and the precursor ions from the ion trap,
- wherein the scan function comprises a constant radio frequency voltage, a sweeping excitation frequency, and successive ejection frequency scans of variable duration and variable frequency range based on the sweeping excitation frequency.
A method for analyzing a sample in a mass spectrometer, the method comprising:
- storing ions produced from the sample in an ion trap of the mass spectrometer;
- and
- applying a scan function to the ion trap comprising
- exciting at least a portion of the ions selectively over time, and
- ejecting at least one of product ions and precursor ions from the ion trap, wherein the scan function comprises a sweeping radio frequency voltage, an excitation frequency, and successive ejection frequency scans, wherein the sweeping radio frequency voltage is ramped from a first voltage to a second voltage greater than the first voltage.
A mass spectrometer comprising:
- an ion trap configured to receive ions produced from a sample;
- and
- a controller configured to apply a scan function to the ion trap comprising
- excite at least a portion of the ions selectively over time, and
- eject at least one of product ions and precursor ions from the ion trap,
- wherein the scan function comprises a sweeping radio frequency voltage, an excitation frequency, and successive ejection frequency scans, and the sweeping radio frequency voltage is ramped from a first voltage to a second voltage greater than the first voltage.
(canceled)
22-61. (canceled)
Dependencies are inferred from the claim text.