Methods, systems, and computer readable media for testing electrical and optical interconnect devices
AssigneeKeysight Technologies, Inc.
InventorCharles William Seifert, JR.
Life of this patent
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AssigneeKeysight Technologies, Inc.
InventorCharles William Seifert, JR.
Estimating the term…
A method for testing electrical and optical interconnect devices includes reading, via a port of an interconnect device test system and from an interconnect device under test, CMIS data, automatically creating an interconnect library database record in an interconnect library database, and storing the CMIS data in the interconnect library database record. The method further includes storing tap settings in the interconnect library database record. The method further includes using the CMIS data and the tap settings to configure a test for testing the interconnect device under test. The method further includes recording results of the test and storing the results of the test in the interconnect library database record. The method further includes comparing at least the CMIS data of the interconnect device under test with CMIS data of another interconnect device stored in a user-selected interconnect library database record and reporting results of the comparing.
A system for testing electrical and optical interconnect devices, the system comprising:
A method for testing electrical and optical interconnect devices, the method comprising:
A non-transitory computer readable medium having stored thereon computer-executable instructions that when executed by a processor of a computer control the computer to perform steps comprising:
Dependencies are inferred from the claim text.