Optical analysis device, optical analysis method, and program for optical analysis device
AssigneeHoriba, Ltd.
InventorTakashi SAITO
Life of this patent
Estimating the term…
Loading patent…
AssigneeHoriba, Ltd.
InventorTakashi SAITO
Estimating the term…
An optical analysis device that analyzes a target component by guiding light emitted from a light source to a measuring cell and detecting light transmitted through the measuring cell by a detector, the optical analysis device includes a moving mirror that reflects the light emitted from the light source while reciprocating, a moving mechanism that reciprocates the moving mirror, a movement control unit that controls an applied voltage or an applied current to the moving mechanism, and a cause estimation unit that estimates a cause of an abnormality affecting the moving mirror by using actual waveform data indicating an applied voltage or an applied current to the moving mechanism at each time and reference waveform data acquired in advance and indicating an applied voltage or an applied current to the moving mechanism at each time.
An optical analysis device that analyzes a target component by guiding light emitted from a light source to a measuring cell and detecting light transmitted through the measuring cell, the optical analysis device comprising:
A optical analysis method is a method used by an optical analysis device that analyzes a target component by guiding light emitted from a light source to a measuring cell and detecting light transmitted through the measuring cell, the optical analysis device including:
(canceled)
An optical analysis device that analyzes a target component by guiding light emitted from a light source to a measuring cell and detecting light transmitted through the measuring cell, the optical analysis device comprising:
(canceled)
Dependencies are inferred from the claim text.