Method for system for automatically generating the design rule document of a semiconductor device

A method for automatically generating a design rule document of a semiconductor device, performed by a processor of an electronic device, comprising:

• predicting a tested experimental design method from various experimental design methods based on a device type for designing the semiconductor device, number of various experimental factors, and an experimental goal;
• automatically providing recommended parameter values of undesigned factors based on the experimental factors and the device type;
• automatically generating a test device template based on the experimental factors and the recommended parameter values of the undesigned factors and allocating a plurality of the test device templates to a layout space to output a layout file that is provided for manufacturing a device under test (DUT);
• receiving measurement parameters, transmitting a test condition document that is able to be read by a test machine to the test machine, and receiving a test result caused by measuring the DUT based on the measurement parameters;
• and
• analyzing the test result to provide a combination of parameters that is a recommended combination of parameters generated by the processor based on the test result and generating the design rule document based on the combination of parameters.