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US 2026/0194477 A1Published application
Material characterization of crystalline silicon solar photovoltaic panels using x-ray fluorescence
OwnerDwarak Ravikumarinventor
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Abstract
Assessing concentrations of components in a photovoltaic panel includes exposing a region of a photovoltaic panel to irradiation from an X-ray fluorescence spectrometer. Exposing the region of the photovoltaic panel ionizes a multiplicity of atoms in the region, and each atom of the multiplicity of atoms corresponds to a chemical component. The radiation emitted by the multiplicity of atoms is analyzed to assess a concentration of each chemical component in the region.
Claims10
A method of assessing concentrations of components in a photovoltaic panel, the method comprising:
- exposing a region of a photovoltaic panel to irradiation from an X-ray fluorescence spectrometer, thereby ionizing a multiplicity of atoms in the region, wherein each atom corresponds to a chemical component;
- and
- analyzing radiation emitted by the multiplicity of atoms to assess a concentration of each chemical component in the region.
Dependencies are inferred from the claim text.