Particle characterization in flow cytometry
AssigneeBeckman Coulter, Inc.
InventorIhor BEREZHNYY
Life of this patent
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Abstract
A detection system for analyzing particles is described. The detection system detects radiated light as a particle passes through a light beam and generates a waveform as a digital representation of the radiated light detected from the particle. The detection system performs a waveform regression analysis on the waveform to obtain coefficients for characterizing the waveform and assigns one or more characteristics to the particle based on the coefficients.
Claims14
A detection system for analyzing particles, the detection system comprising:
- one or more processing devices;
- and
- a memory storage device storing instructions which, when executed by the one or more processing devices, cause the one or more processing devices to:
- detect radiated light as a particle passes through a light beam;
- generate a waveform as a digital representation of the radiated light;
- perform a waveform regression analysis on the waveform to obtain coefficients characterizing the waveform;
- and
- assign one or more characteristics to the particle based on the coefficients.
A method of characterizing a particle using a flow cytometer, the method comprising:
- detecting radiated light as the particle passes through a light beam;
- generating a waveform as a digital representation of the radiated light;
- performing a waveform regression analysis on the waveform to obtain coefficients characterizing the waveform;
- and
- assigning one or more characteristics to the particles based on the coefficients.
Dependencies are inferred from the claim text.