Observation Apparatus and Observation Method
AssigneeSCREEN Holdings Co., Ltd.
InventorsMitsuhiro YABU, Yuya KIMURA
Life of this patent
Estimating the term…
Loading patent…
AssigneeSCREEN Holdings Co., Ltd.
InventorsMitsuhiro YABU, Yuya KIMURA
Estimating the term…
This observation apparatus observes a particle trapped by a plurality of electrodes extending in a direction crossing a channel formed in a transparent substrate, and includes an imaging unit, a camera moving mechanism that moves an imaged area of the imaging unit, and a control unit. The control unit includes an end-electrode detection unit that detects an end electrode positioned at an end of the channel, an adjacent-electrode detection unit that detects an adjacent electrode adjacent to the end electrode, a channel wall detection unit that detects a sidewall of the channel, and an observation position adjustment unit that adjusts an observation position where the particle is observed, on the basis of the positions of the end electrode, the adjacent electrode, and the sidewall. This enables proper alignment in observation of particles trapped in the vicinity of the electrodes in the substrate such as a micro-channel chip.
An observation apparatus that observes a particle trapped by a plurality of electrodes extending in a direction crossing a channel formed in a transparent substrate, comprising:
An observation method for observing a particle trapped by a plurality of electrodes extending in a direction crossing a channel formed in a transparent substrate, comprising the steps of:
Dependencies are inferred from the claim text.