Method for setting up a cvd reactor
AssigneeAixtron SE
InventorsPeter Sebald LAUFFER, Hassan LARHRIB, Ilio MICCOLI
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AssigneeAixtron SE
InventorsPeter Sebald LAUFFER, Hassan LARHRIB, Ilio MICCOLI
Estimating the term…
A method for predicting a change in values of a layer property or a local variable at a storage location at which a layer is deposited on a substrate. If an individual treatment parameter at a storage location is changed, not only do values that are attributable to the individual parameters at the storage location change, but so do the values at other storage locations. In the method, starting layers having individual starting parameters are deposited, and test layers having test parameters are deposited. From detected starting and test values, a sensitivity matrix can be formed with elements that each indicate the influence of a change in each of the individual parameters on each of the values of the layer property or local variable. By inverting the sensitivity matrix, correction parameters can be calculated in order to pre-set individual parameters, by means of which specified target values can be achieved.
A method for creating a sensitivity matrix, Si,j, with elements that indicate an influence of each change in a treatment parameter on layer property values, λi, (i) of layers or layer sequences deposited on a plurality of substrates (7) arranged at spatially separate storage locations (5′) in a process chamber (2) or (ii) of a local variable influencing a layer growth at the storage location (5′), the method comprising:
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Dependencies are inferred from the claim text.