Method of producing hard mask
AssigneeUlvac, Inc.
InventorsShinji KOHARI, Motohide NISHIMURA, Keita ARAI
Life of this patent
Estimating the term…
Loading patent…
AssigneeUlvac, Inc.
InventorsShinji KOHARI, Motohide NISHIMURA, Keita ARAI
Estimating the term…
A target is made of tungsten, a rare gas and nitrogen gas are introduced into a processing chamber of a vacuum atmosphere, and a tungsten nitride film is deposited on a surface of a substrate to be treated by a reactive sputtering manner, and a second step in which a target is made of tungsten, and a tungsten film is deposited on a surface of the tungsten nitride film in a processing chamber of the vacuum atmosphere are included. A flow rate ratio of the rare gas to the nitrogen gas and a pressure in the processing chamber are set to 1.5 or less and 1 Pa or more, respectively, in the first step, and a stress is adjusted depending on a film thickness of the tungsten film by controlling at least one of a total pressure in the processing chamber and a bias electric power supplied to the substrate to be treated at the time of deposition in the second step.
(canceled)
(canceled)
A method of producing a hard mask, comprising:
Dependencies are inferred from the claim text.