Method for the evaluation of the critical slip distance

Abstract

The present disclosure relates to a method for determining a critical slip distance, CSD, for a sample, the method comprising: providing a force to the sample towards a sliding surface; sliding the sample n times along the sliding surface over a plurality of intervals, the plurality of intervals having different widths w, n being an integer ≥1; determining, for each width wi, a respective wear rate m(wi)=ΔM/(n*wi) of a plurality of wear rates m(w), wherein ΔM is a weight difference of the sample after sliding the sample over n intervals of width wi as compared to before the sliding; and determining, based on the plurality of wear rates and the respective widths, the CSD as a width w0, wherein, for any (I). w > w 0 , ∂ m ⁡ ( w ) ∂ w = 0 ( I )

Dependencies are inferred from the claim text.