Scaling Factors in Low Density Parity Check
AssigneeSK Hynix NAND Product Solutions Corp. (dba Solidigm)
InventorZion KWOK
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AssigneeSK Hynix NAND Product Solutions Corp. (dba Solidigm)
InventorZion KWOK
Estimating the term…
This application is directed to data validation on an electronic device. The electronic device obtains a data block including a plurality of data bits, and identifies variable nodes and check nodes. Each variable node corresponds to a distinct data bit. For a first variable node, the electronic device determines a conversion factor indicating a quality of the check node data of the check nodes with reference to variable node data of the first variable node, identifies a first set of check nodes for which the variable node data of the first variable node is applied to determine the check node data of each of the first set of check nodes, determines a scaling factor based on at least the conversion factor, and determines variable node data of the first variable node by at least applying the scaling factor to the check node data of the first set of check nodes.
A method implemented at an electronic device for data validation, comprising:
An electronic device, comprising:
A non-transitory computer-readable storage medium storing one or more programs for execution by one or more processors, the one or more programs comprising instructions for:
Dependencies are inferred from the claim text.