Test process analysis method and apparatus, electronic device, and storage medium

An electronic device, comprising a processor and a memory, the memory storing computer program instructions which, when executed by the processor, cause the processor to:

• acquire service information of input nodes connected to a plurality of input lines that are connected to the multi-input multi-output node, output nodes connected to a plurality of output lines that are connected to the multi-input multi-output node, and the multi-input multi-output node, the service information of nodes comprising preset node information and node information set when building the test process;
• determine an analysis order of the nodes based on connection relationship between the nodes, an analysis order of the input nodes preceding an analysis order of the multi-input multi-output node and an analysis order of the output nodes;
• and
• configure the service information of the nodes to corresponding nodes in accordance with the determined analysis order of the nodes, to analyze the test process into a plurality of ordered operations.

A non-transitory computer-readable storage medium, storing program instructions, wherein the program instructions, when executed by a processor, cause the processor to:

• acquire service information of input nodes connected to a plurality of input lines that are connected to the multi-input multi-output node, output nodes connected to a plurality of output lines that are connected to the multi-input multi-output node, and the multi-input multi-output node, the service information of nodes comprising preset node information and node information set when building the test process;
• determine an analysis order of the nodes based on connection relationship between the nodes, an analysis order of the input nodes preceding an analysis order of the multi-input multi-output node and an analysis order of the output nodes;
• and
• configure the service information of the nodes to corresponding nodes in accordance with the determined analysis order of the nodes, to analyze the test process into a plurality of ordered operations.