Trench capacitor with bottom barrier electrode
AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsGuanyu Luo, Ming-Che Lee, Che Wei Yang, Bi-Shen Lee, Sheng-Chau Chen
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AssigneeTaiwan Semiconductor Manufacturing Company, Ltd.
InventorsGuanyu Luo, Ming-Che Lee, Che Wei Yang, Bi-Shen Lee, Sheng-Chau Chen
Estimating the term…
An integrated chip including a first conductive interconnect, a dielectric structure, and a trench capacitor. The first conductive interconnect is over a semiconductor substrate. The dielectric structure includes a plurality of dielectric layers over the first conductive interconnect. The trench capacitor is over the dielectric structure and extends between sidewalls of the dielectric structure to the first conductive interconnect. The trench capacitor includes a bottom electrode layer, a top electrode layer over the bottom electrode layer, and a first insulator layer between the bottom electrode layer and the top electrode layer. A lower surface of the first insulator layer is between the sidewalls of the dielectric structure and spaced over an upper surface of the first conductive interconnect. The bottom electrode layer includes a first metal compound which extends from the lower surface of the first insulator layer to the upper surface of the first conductive interconnect.
An integrated chip comprising:
An integrated chip comprising:
A method for forming an integrated chip, the method comprising:
Dependencies are inferred from the claim text.