Examination device (1) for determining the chemical composition (CC) of a used refractory material specimen (M), characterized in that the examination device (1) comprises a laser source (2), configured to irradiate a pulsed laser beam (L) onto an examination section (E) of the refractory material specimen (M) to form a plasma in said examination section (E) during a breakdown step, that the examination device (1) comprises a detection unit (3), configured to record spectral emission(S) from the examination section (E) during a recording step, and that the examination device (1) comprises an evaluation unit (4), configured to determine during an evaluation step the chemical composition in the examination section (E) using the recorded spectral emission(S) while during the evaluation step using a spectral line at a wavelength of about 193 nm to determine the carbon content in the examination section (E), wherein the chemical composition (CC) of the used refractory material specimen (M) is determined by using said chemical composition in the examination section (E) while the carbon content in the examination section (E) is determined by using an auxiliary spectral line at an auxiliary wavelength of the recorded spectral emission., wherein an auxiliary spectral line of oxygen is used.