High power seed layer patterning on piezoelectric thin films for piezoelectric device fabrication
AssigneeApplied Materials, Inc.
InventorsBharatwaj RAMAKRISHNAN, Vijay Bhan SHARMA
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AssigneeApplied Materials, Inc.
InventorsBharatwaj RAMAKRISHNAN, Vijay Bhan SHARMA
Estimating the term…
Embodiments of the present disclosure relate to a method of forming a piezoelectric device. The method of forming a piezoelectric device includes at one operation disposing a bottom electrode over a substrate and disposing a high power seed layer over the bottom electrode via physical vapor deposition at a target bias power greater than 3 kW. The method further includes disposing a piezoelectric layer over the bottom electrode and forming a top electrode with a top electrode pattern over the piezoelectric layer. A piezoelectric device includes a bottom electrode disposed over a substrate. A high power seed layer is disposed over the bottom electrode. A piezoelectric layer is disposed over the high power seed layer. A high power seed layer grain size matches a piezoelectric grain size and a high power seed layer grain orientation matches a piezoelectric grain orientation. A top electrode is disposed over the piezoelectric layer.
A method of forming a piezoelectric device, comprising:
A piezoelectric device, comprising:
A method of forming a piezoelectric device, comprising:
Dependencies are inferred from the claim text.