Fractional divider calibration with dual digital control delay circuits
AssigneeRenesas Electronics America Inc.
InventorChengming HE
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AssigneeRenesas Electronics America Inc.
InventorChengming HE
Estimating the term…
Systems and methods for calibrating a fractional divider are described. A system can include a divider and a circuit. The divider can divide an input clock signal to generate an integer output divider (IOD) signal. The circuit can include a first digital control delay (DCD) circuit configured to delay the IOD signal to generate a first delayed IOD signal. The circuit can further include a second DCD circuit configured to delay the first delayed IOD signal to generate a second delayed IOD signal. The circuit can further include an edge sampler configured to compare an edge of the second delayed IOD signal with an edge of the input clock signal. The circuit can further include a controller configured to calibrate the first DCD circuit based on a result of the comparison between the edge of the second delayed IOD signal with the edge of the input clock signal.
A semiconductor device comprising:
A system comprising:
A method comprising:
Dependencies are inferred from the claim text.