Testing method for electronic device and test system

A testing method for an electronic device, the testing method comprising:

• receiving a plurality of first test data for a plurality of first test cases and a plurality of second test data for a plurality of second test cases, wherein the plurality of first test data and the plurality of second test data indicate results of one or more electronic devices applying the plurality of first test cases and the plurality of second test cases to perform operations;
• generating a plurality of first local scores based on the plurality of first test data;
• generating a plurality of second local scores based on the plurality of second test data;
• performing a first mutation operation based on at least one of the plurality of first test cases to generate test cases of a first pre-test group;
• performing a second mutation operation based on at least one of the plurality of first test cases to generate test cases of a second pre-test group;
• and
• adding a first local optimal test case corresponding to a highest score among the plurality of first local scores and a second local optimal test case corresponding to the highest score among the plurality of second local scores to the first pre-test group to generate a subsequent test group that includes the test cases of the first pre-test group, the first local optimal test case, and the second local optimal test case,
• wherein the subsequent test group is configured to be provided to at least one electronic device of the one or more electronic devices, to cause the at least one electronic device to apply the subsequent test group to perform the operations.

A test system comprising:

• a first electronic device comprising a first memory module configured to output a plurality of first data by operating using operation conditions of a plurality of first test cases, wherein the first electronic device is configured to generate a plurality of first test data based on the plurality of first data;
• a second electronic device comprising a second memory module configured to output a plurality of second data by operating using operation conditions of a plurality of second test cases, wherein the second electronic device is configured to generate a plurality of second test data based on the plurality of second data;
• and
• a test device configured to:
• generate a plurality of first local scores based on the plurality of first test data,
• generate a plurality of second local scores based on the plurality of second test data,
• generating a global score based on common test data of the plurality of first test data and the plurality of second test data, wherein the common test data corresponds to a common test case that is included in the plurality of first test cases and in the plurality of second test cases,
• replace at least one of the plurality of first local scores with the global score to generate a plurality of first test scores,
• replace at least one of the plurality of second local scores with the global score to generate a plurality of second test scores, and
• perform a first mutation operation based on a first optimal test case corresponding to the highest score among the plurality of first test scores to generate test cases of a first pre-test group,
• wherein the test cases of the first pre-test group are configured to be provided to the first electronic device, to cause the first memory module operate using the test cases of the first pre-test group,