Method of inspecting display panel and method of manufacturing electronic device
AssigneeSamsung Display Co., Ltd.
InventorsSEOKGI BAEK, KI-HOON LEE, DUHYUN KIM, TAE-JIN JANG
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Abstract
An inspecting method of a display panel includes testing a pixel circuit including a first capacitor connected between a first node and a second node, a first transistor including a first electrode connected to a third node, a gate electrode connected to the first node, and a second electrode connected to the second node, and a second transistor connected between the first node and a data line. The testing of the pixel circuit includes applying a first test voltage to the first node, forming a current path between the third node and the second node, and measuring a current flowing through the first node via the data line.
Claims20
A method of inspecting a display panel, comprising:
- testing a pixel circuit comprising a first capacitor connected between a first node and a second node, a first transistor comprising a first electrode connected to a third node, a gate electrode connected to the first node, and a second electrode connected to the second node, and a second transistor connected between the first node and a data line, the testing of the pixel circuit comprising:
- applying a first test voltage to the first node;
- forming a current path between the third node and the second node;
- and
- measuring a current flowing through the first node via the data line.
A method of manufacturing an electronic device, comprising:
- forming a pixel circuit comprising a plurality of transistors and a plurality of capacitors;
- testing the pixel circuit;
- and
- forming a light emitting element connected to the pixel circuit, the pixel circuit comprising:
- a first capacitor connected between a first node and a second node;
- a first transistor comprising a first electrode connected to a third node, a gate electrode connected to the first node, a second electrode connected to the second node, and a back gate electrode;
- a second transistor connected between the first node and a data line;
- a third transistor connected between a first voltage line and the first node;
- a fourth transistor connected between a second voltage line and a fourth node;
- a fifth transistor connected between a third voltage line and the third node;
- a sixth transistor connected between the second node and the fourth node;
- and
- a second capacitor connected between the third voltage line and the back gate electrode of the first transistor, the testing of the pixel circuit comprising:
- applying a first test voltage to the first node;
- forming a current path between the third node and the second node;
- and
- measuring a current flowing through the first node via the data line.
A method of manufacturing a display panel, comprising:
- forming a pixel circuit comprising:
- a first transistor comprising a gate electrode connected to a first node, a first electrode connected to a third node, and a second electrode connected to a second node;
- a first capacitor connected between the first node and the second node;
- and
- a second transistor connected between the first node and a data line;
- applying a first test voltage to the first node;
- applying a second test voltage to the second node;
- applying a third test voltage, different from the second test voltage, to the third node, to form a current path through the first transistor;
- turning on the second transistor and applying a bias voltage to the data line;
- measuring a current flowing from the first node through the second transistor to the data line;
- and
- forming a light emitting element electrically connected to the pixel circuit when the measured current indicates the pixel circuit is functioning normally.
Dependencies are inferred from the claim text.