Information processing device and information processing method
AssigneePanasonic Intellectual Property Management Co., Ltd.
InventorsNAOKI NOJIRI, HIDEAKI HAMADA, MITSUO SAITOH, SATORU KISHIMOTO
Life of this patent
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Abstract
An information processing device includes a processor that estimates a state of a workpiece to be processed by a processing device that repeatedly performs processing, and a storage device that stores an operation parameter for estimating the state of the workpiece. The processor acquires waveform data indicating a measurement result of a transition of a processing load in a processing cycle by the processing device, and estimates at least one of hardness and thickness of the workpiece as the state of the workpiece based on a height of the waveform indicated by the waveform data, a width of the waveform, and the operation parameter.
Claims12
An information processing device comprising:
- a processor that estimates a state of a workpiece to be processed by a processing device that repeatedly performs processing;
- and
- a storage device that stores an operation parameter for estimating the state of the workpiece,
- wherein
- the processor acquires waveform data indicating a measurement result of a transition of a processing load in a processing cycle by a processing device, and
- the processor estimates at least one of hardness and thickness of the workpiece as the state of the workpiece based on a height of a waveform indicated by the waveform data, a width of the waveform, and the operation parameter.
An information processing method for estimating a state of a workpiece to be processed by a processing device that repeatedly performs processing, the information processing method comprising:
- acquiring waveform data indicating a measurement result of a transition of a processing load in a processing cycle by the processing device;
- and
- estimating at least one of hardness and thickness of the workpiece as the state of the workpiece based on a height of a waveform indicated by the waveform data, a width of the waveform, and an operation parameter for estimating the state of the workpiece.
Dependencies are inferred from the claim text.