Robot system with supplementary metrology position determination system
AssigneeMitutoyo Corporation
InventorMichael NAHUM
Life of this patent
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AssigneeMitutoyo Corporation
InventorMichael NAHUM
Estimating the term…
A supplementary metrology position determination system is provided for use with a robot. The robot includes a movable arm configuration and a motion control system configured to control an end tool position with a robot accuracy (i.e., based on sensors included in the robot). The supplementary system includes cameras and scales, each of which is attached to the movable arm configuration. Cameras are coupled to arm portions (e.g., at or near distal ends of the arm portions) such that the cameras rotate around scales (e.g., as the arm portions rotate around rotary axes). The scales may be at least partially cylindrical. The cameras are operated to acquire images of the scales for determining angular positions and/or bending and/or twisting of the arm portions of the robot. Such information may be utilized to achieve higher accuracy (e.g., for measurement operations and/or control of the robot, etc.).
A robot system, comprising:
A method for operating a supplementary metrology position determination system that is utilized with a robot,
A supplementary metrology position determination system for use with a robot that comprises a movable arm configuration with first and second arm portions, first and second rotary joints, and an end tool mounting configuration for mounting an end tool, and a motion control system configured to control an end tool position of the end tool, the supplementary metrology position determination system comprising:
Dependencies are inferred from the claim text.