Distributed test pattern generation and synchronization
AssigneeSynopsys, Inc.
InventorsPeter Wohl, Khader Abdel-Hafez, Michael Dylan Dsouza
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Abstract
A method for performing an asynchronous automatic test-pattern generation (ATPG) by an ATPG machine includes, in part, generating a set of test patterns; detecting one or more faults associated with the set of test patterns; and receiving, from an ATPG manager, information relating to undetected faults. The method further includes, in part, updating the fault state of the ATPG machine in response to a degree of staleness of a fault state of the ATPG machine determined based at least on the information relating to the undetected faults from the ATPG manager.
Claims20
A method for performing an asynchronous automatic test-pattern generation (ATPG) by an ATPG machine, the method comprising:
- generating a set of test patterns;
- detecting one or more faults associated with the set of test patterns;
- receiving information relating to undetected faults;
- and
- responsive to a degree of staleness of a fault state of the ATPG machine determined based at least on the information relating to the undetected faults, updating the fault state of the ATPG machine.
A system for automatic test-pattern generation (ATPG), the system comprising:
- one or more memory components;
- and
- one or more processors coupled to the one or more memory components, the one or more processors configured to:
- instruct a plurality of ATPG workers to generate a first set of test patterns;
- and
- responsive to receiving, from the one or more ATPG workers, fault detections associated with the first set of test patterns generated, communicate to the plurality of ATPG workers the one or more fault detections previously undetected by the one or more ATPG workers.
A non-transitory computer-readable apparatus comprising a storage medium, the storage medium comprising a plurality of instructions configured to, when executed by one or more processors, cause the one or more processors to:
- generate a first plurality of test patterns over a first interval;
- communicate one or more faults associated with the first plurality of test patterns to an automatic test-pattern generation (ATPG) manager apparatus;
- receive, from the ATPG manager, information indicative of faults detected by one or more other ATPG apparatus during the first interval;
- and
- update a fault state of the ATPG manager apparatus with the information indicative of faults.
Dependencies are inferred from the claim text.