Test device, method and system

A test method, comprising:

• in a training mode:
• electrically connecting to a sample wafer which comprises a plurality of sample dies;
• and
• inputting WAT sample data of the sample wafer into a machine learning model to train the machine learning model to predict a process factor of each sample die;
• and
• in a test mode:
• electrically connecting to a wafer which is to be tested and which comprises a plurality of dies to be tested;
• inputting WAT data of the wafer to be tested into the machine learning model so that the machine learning model predicts a process factor of each die to be tested;
• converting the process factor of each die to be tested to generate a trim value;
• and
• providing the trim value to a first function circuit of a corresponding die to be tested.

A test system, comprising:

• a test platform configured to dispose a sample wafer or a wafer to be tested;
• a storage circuit storing a machine learning model;
• and
• a processing circuit accessing the machine learning model,
• wherein:
• in a training mode:
• the sample wafer is disposed on the test platform,
• the processing circuit is electrically connected to the sample wafer which comprises a plurality of sample dies;
• and
• the processing circuit loads the machine learning model and inputs WAT sample data of the sample wafer into the machine learning model to train the machine learning model to predict a process factor of each sample die, and
• in a test mode:
• the wafer to be tested is disposed on the test platform,
• the processing circuit is electrically connected to the wafer which is to be tested and which comprises a plurality of dies to be tested,
• the processing circuit inputs WAT data of the wafer to be tested into the machine learning model to predict a process factor of each die to be tested, and
• the processing circuit converts the process factor of each die to be tested to generate a trim value and provides the trim value to a first function circuit of a corresponding die to be tested.