Universal serial bus type-c connecter chip, test system and calibration method of universal serial bus type-c connecter chip

A test system, comprising:

• a test circuit, configured to transmit a test command;
• a universal serial bus type-C (USB-C) connector chip, coupled to the test circuit, wherein the USB-C connector chip comprises:
• a determination circuit, configured to determine whether a detection voltage on a first input terminal of the determination circuit reaches a threshold voltage on a second input terminal of the determination circuit, in order to generate a determination signal, wherein the first input terminal is coupled to a detection pin of the USB-C connector chip;
• and
• a calibration control circuit, coupled to the determination circuit, configured to calibrate the threshold voltage transmitted to the second input terminal according to the test command;
• and
• a digital-to-analog converter (DAC), coupled to the USB-C connector chip, configured to output the detection voltage to the detection pin of the USB-C connector chip;
• wherein:
• in a first calibration phase, the calibration control circuit controls the DAC to output the detection voltage having a first direct current (DC) level, sets the threshold voltage to multiple candidate calibration levels to obtain multiple first determination results of the determination signal, and selects a first calibration level from the multiple candidate calibration levels according to the multiple first determination results;
• in a second calibration phase, the calibration control circuit controls the DAC to output the detection voltage having a second DC level, sets the threshold voltage to the multiple candidate calibration levels to obtain multiple second determination results of the determination signal, and selects a second calibration level from the multiple candidate calibration levels according to the multiple second determination results;
• and
• the calibration control circuit determines a final calibration level of the threshold voltage according to the first calibration level and the second calibration level.

A calibration method of a universal serial bus type-C (USB-C) connecter chip, comprising:

• in a first calibration phase, setting a detection voltage on a first input terminal of a determination circuit to a first direct current (DC) level;
• in the first calibration phase, setting a threshold voltage on a second input terminal of the determination circuit to multiple candidate calibration levels;
• in the first calibration phase, utilizing the determination circuit to determine whether the multiple candidate calibration levels reach the first DC level, in order to generate multiple first determination result of a determination signal;
• in the first calibration phase, selecting a first calibration level from the multiple candidate calibration levels according to the multiple first determination results;
• in a second calibration phase, setting the detection voltage on the first input terminal of the determination circuit to a second DC level;
• in the second calibration phase, setting the threshold voltage on the second input terminal of the determination circuit to the multiple candidate calibration levels;
• in the second calibration phase, utilizing the determination circuit to determine whether the multiple candidate calibration levels reach the second DC level, in order to generate multiple second determination result of the determination signal;
• in the second calibration phase, selecting a second calibration level from the multiple candidate calibration levels according to the multiple second determination results;
• and
• determining a final calibration level according to the first calibration level and the second calibration level.