Method and scanning apparatus for scanning a component
AssigneeROLLS-ROYCE plc
InventorAkhil MULLOTH
Life of this patent
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AssigneeROLLS-ROYCE plc
InventorAkhil MULLOTH
Estimating the term…
A method for scanning a component includes providing a filter and the component, the filter at least partially surrounding the component. The filter comprises a multi-phase material that has an attenuation coefficient that is lower than an attenuation coefficient of a material of the component to be scanned. The method further includes disposing the component and the filter on a support platform, and providing an imaging beam source and an imaging beam receiver. The support platform is configured to rotate and/or revolve relative to the imaging beam source and the imaging beam receiver about one or more axes. The method includes generating, via the imaging beam source, an imaging beam that passes through the component and the filter. The method includes attenuating, via the, a scatter beam that is produced upon irradiation of the component with the imaging beam.
A method for scanning a component, the method comprising the steps of:
A combination of a scanning apparatus for scanning a component and a filter at least partially surrounding the component, comprises a multi-phase material that has an attenuation coefficient that is lower than an attenuation coefficient of a material of the component to be scanned, the scanning apparatus comprising:
Dependencies are inferred from the claim text.