Apparatus for performing an examination of an object by means of x-ray radiation

An apparatus for performing an examination of an object via X-ray radiation, the apparatus comprising:

• an X-ray source configured to emit X-ray radiation;
• an X-ray detector configured to detect at least some of the X-ray radiation emitted by the X-ray source;
• a radiation region formed between the X-ray source and the X-ray detector;
• an object support configured to hold the object, the object support configured to be arranged in the radiation region for performing the examination;
• an analysis unit coupled to the X-ray detector, the analysis unit configured to analyze a radiation signal from the X-ray detector;
• a functional component arranged in the radiation region, the functional component configured to move in a movement direction and having at least one conductive region, wherein the at least one conductive region includes at least one of an electrically conductive region or a magnetically conductive region;
• and
• a position sensor having an electrical coil arrangement configured to
• sense the at least one conductive region, and
• provide a summation voltage based on sensing of the at least one conductive region, wherein the electrical coil arrangement includes an exciter coil configured to provide an alternating magnetic field, and two series-connected sense coils configured to sense at least part of the alternating magnetic field,
• the two series-connected sense coils and the exciter coil are arranged such that the summation voltage across the two series-connected sense coils depends on a position of the functional component relative to the position sensor, and
• the apparatus is configured to determine a position signal based on the summation voltage, the position signal relating to the position of the functional component relative to the position sensor.