Non-Contact Voltage Tester
AssigneeRobert Bosch GmbH
InventorsChi Fung Chan, Ann-Kathrin Hahmann, Jianbang Ying, Kunal Shyamadas Burman, Thomas Kohlert, Xinhui Zhang
Life of this patent
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Abstract
A non-contact voltage tester includes a microcontroller communicatively connected to the following components: (i) a probe for detecting a voltage based on electromagnetic or electrical field induction, (ii) at least two output devices, which provide an optical, acoustic and/or mechanical output based on a voltage detected by the probe, (ii) a switch, wherein the switch connects to an analog-digital conversion channel of the microcontroller to the respective output device. A method, a computer program, a device, and a storage medium for this purpose are also disclosed.
Claims11
A non-contact voltage tester, comprising:
- a microcontroller;
- a probe configured to detect a voltage based on electromagnetic or electrical field induction;
- at least two output devices, which are configured to provide an optical, acoustic and/or mechanical output based on a voltage detected by the probe;
- a switch configured to connect an analog-digital conversion channel of the microcontroller to the respective output device,
- wherein the microcontroller is communicatively connected to the probe, the at least two output devices, and the switch.
Dependencies are inferred from the claim text.