Specimen measurement system and specimen measurement apparatus
AssigneeSysmex Corporation
InventorsTakehiko Akakabe, Yasuhiro Ohyama, Takaaki Hadano
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AssigneeSysmex Corporation
InventorsTakehiko Akakabe, Yasuhiro Ohyama, Takaaki Hadano
Estimating the term…
A specimen measurement system includes: a measurement unit configured to measure a specimen; and a control unit configured to analyze measurement data from the measurement unit. The measurement unit includes: a first reagent container accommodating a first reagent containing a substance that binds to an analyte in the specimen; a reagent holder configured to hold the first reagent container; a specimen processor configured to prepare a measurement sample by mixing the first reagent and the specimen; and a detector configured to interrogate the analyte for the measurement of the measurement sample. The measurement unit is arranged on a housing that stores a second reagent container, the second reagent container containing a second reagent used for at least one of: washing of a flow path of the measurement unit, dilution of the specimen, preparation of the measurement sample, and interrogation of the analyte of the measurement sample by the detector.
A specimen measurement system comprising:
Dependencies are inferred from the claim text.