Optical-type foreign matter inspection device
AssigneeHitachi High-Tech Corporation
InventorsTomoharu NAGASHIMA, Hisaaki KANAI, Masami MAKUUCHI, Kazuma OGAWA, Masaya YAMAMOTO
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AssigneeHitachi High-Tech Corporation
InventorsTomoharu NAGASHIMA, Hisaaki KANAI, Masami MAKUUCHI, Kazuma OGAWA, Masaya YAMAMOTO
Estimating the term…
capable of detecting a size of a large foreign matter with high accuracy is provided. A laser power monitor 109 measures, based on a monitor signal 132 from an optical sensor 107, laser power with which a surface of a sample 100 is irradiated. An optical sensor 111 receives light scattered or reflected from the surface of the sample 100, and outputs a sensor output signal 134 according to a received light amount. A controller determines presence or absence of a large foreign matter exceeding a predetermined size based on the sensor output signal 134, reduces the laser power using a variable optical attenuator 104 when it is determined that the large foreign matter is present, and corrects, based on a measurement value of the laser power by the laser power monitor 109, the sensor output signal 134 within a reduction period of the laser power.
An optical-type foreign matter inspection device for inspecting a foreign matter on a surface of a sample, the optical-type foreign matter inspection device comprising:
An optical-type foreign matter inspection device for inspecting a foreign matter on a surface of a sample, the optical-type foreign matter inspection device comprising:
Dependencies are inferred from the claim text.