Back to results
US 2026/0148358 A1Published application
Measuring deformation of structure
AssigneeAirbus Operations GmbH
InventorJai WALL
Life of this patent
Estimating the term…
Abstract
A method of measuring deformation of a structure by image correlation, including generating a non-periodic tiling with a set of prototiles; generating a non-periodic pattern based on the non-periodic tiling; applying the non-periodic pattern to a structure; generating a reference image of the non-periodic pattern on the structure; generating a deformed image of the non-periodic pattern on the structure; and measuring deformation of the structure by comparing the deformed image with the reference image.
Claims8
A method of measuring deformation of a structure by image correlation, the method comprising:
- generating a non-periodic tiling with a set of prototiles;
- generating a non-periodic pattern based on the non-periodic tiling;
- applying the non-periodic pattern to a structure;
- generating a reference image of the non-periodic pattern on the structure;
- generating a deformed image of the non-periodic pattern on the structure;
- and
- measuring deformation of the structure by comparing the deformed image with the reference image.
4 more elements
Dependencies are inferred from the claim text.