Apparatus and methods for recovering power on read failing die
AssigneeSanDisk Technologies LLC
InventorsNavkiran Sandhu, Rajan Paudel, Deepak Bharadwaj, Jiahui Yuan
Life of this patent
Estimating the term…
Abstract
An apparatus is provided that includes a first memory die including first corresponding initialization information and a first data latch, and a first control circuit coupled to the first memory die. The first control circuit is configured to send a power on read command to the first memory die, determine that the first memory die reported a power on read failure, retrieve a first backup copy of the first corresponding initialization information from a first storage location outside the first memory die, and load the retrieved first backup copy of the first corresponding initialization information to the first data latch.
Claims20
An apparatus comprising:
- a first memory die comprising first corresponding initialization information and a first data latch;
- and
- a first control circuit coupled to the first memory die, the first control circuit configured to:
- send a power on read command to the first memory die;
- determine that the first memory die reported a power on read failure;
- retrieve a first backup copy of the first corresponding initialization information from a first storage location outside the first memory die;
- and
- load the retrieved first backup copy of the first corresponding initialization information to the first data latch,
- wherein the first data latch is for initialization and backup.
A memory system comprising:
- a first memory die comprising a first block of memory cells comprising first corresponding initialization information for the first memory die, a first data latch, and a second block of memory cells;
- and
- a second memory die comprising a third block of memory cells comprising second corresponding initialization information for the second memory die, a second data latch and a fourth block of memory cells,
- wherein:
- the second block of memory cells comprises a first backup copy of the second corresponding initialization information,
- wherein the first data latch is for initialization and backup,
- wherein the second data latch is for initialization and backup;
- and
- the fourth block of memory cells comprises a first backup copy of the first corresponding initialization information.
A method comprising:
- manufacturing a first non-volatile memory die and a second non-volatile memory die;
- determining first initialization parameters for the first non-volatile memory die;
- determining second initialization parameters for the second non-volatile memory die;
- programming a first block of memory cells of the first non-volatile memory die with the first initialization parameters;
- programming a second block of memory cells of the first non-volatile memory die with the second initialization parameters;
- programming a first block of memory cells of the second non-volatile memory die with the second initialization parameters;
- and
- programming a second block of memory cells of the second non-volatile memory die with the first initialization parameters,
- wherein:
- the first initialization parameters are configured to load initialize the first non-volatile memory die into a first data latch in response to a power on read command;
- and
- the second initialization parameters are configured to load the second non-volatile memory die into a second data latch in response to the power on read command,
- wherein the first data latch is for initialization and backup, and
- wherein the second data latch is for initialization and backup.
Dependencies are inferred from the claim text.