Inertia measurement unit and method for forming the same
AssigneeAAC Technologies Pte. Ltd.
InventorsQiuyu Tan, Houming Chong, Zaixiang Pua, Zhan Zhan, Kahkeen Lai
Life of this patent
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AssigneeAAC Technologies Pte. Ltd.
InventorsQiuyu Tan, Houming Chong, Zaixiang Pua, Zhan Zhan, Kahkeen Lai
Estimating the term…
Provided are an inertia measurement unit and a method therefor. The inertia measurement unit includes: a first base; a dielectric layer including a notch; a first electric-conductive layer including first openings; a second electric-conductive layer, second openings being formed in the second electric-conductive layer; a second base covering the second electric-conductive layer, a closed space being formed between the second base and the first base, the closed space including a plurality of cavities spaced from one another and having different cavity pressures; a gas-exhaust channel connected to one of the plurality of cavities and configured to connect the one of the plurality of cavities with an outer environment; and a closure portion configured to close the gas-exhaust channel. Cavities having different cavity pressures are formed at a single wafer, and it facilitates formation of an inertia measurement unit that assembles two or more inertial sensors together.
An inertia measurement unit, comprising:
A method for forming an inertia measurement unit,
Dependencies are inferred from the claim text.