Substrate processing method
AssigneeTokyo Electron Limited
InventorsTenta USHIDA, Tadashi MITSUNARI, Miyako KANEKO
Life of this patent
Estimating the term…
Loading patent…
AssigneeTokyo Electron Limited
InventorsTenta USHIDA, Tadashi MITSUNARI, Miyako KANEKO
Estimating the term…
A substrate processing method for forming a carbon-containing film that is inhibited from film peeling due to thermal treatment is provided. The substrate processing method includes: preparing a substrate having a foundation film; forming a carbon-containing film having a film density of 2 g/cm3 or greater on the foundation film by forming a plasma of a processing gas containing a carbon-containing gas; and subjecting the substrate on which the carbon-containing film is formed to thermal treatment. In the forming of the carbon-containing film, for a first time from a start of the forming of the carbon-containing film, an ion energy higher than the ion energy during a second time from an end of first time is supplied to the substrate.
A substrate processing method, comprising:
Dependencies are inferred from the claim text.