X-ray inspection device and article inspection system

An X-ray inspection device that performs relative mass inspection of an inspection object based on an X-ray inspection image obtained by imaging the inspection object transported in a predetermined direction by transmission of X-rays at a predetermined transport position, the X-ray inspection device comprising:

• a morphological feature imaging unit that images the inspection object and outputs classification image data including classifiable morphological features of the inspection object;
• a variant feature image recognition unit that detects an image feature value for each variant, by which a content component type of the inspection object is specifiable, from the classification image data;
• and
• an inspection control unit that varies specific inspection parameters for the relative mass inspection in accordance with the image feature value for each variant recognized by the variant feature image recognition unit.