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US 2026/0133480 A1Published application
Photomask module and photomask pattern transfer method applying the same
AssigneeUnited Microelectronics Corp.
InventorsChun-Yi HSIEH, Chun-Chi YU, Bo-Jou LU
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Abstract
A photomask module includes a first photomask and a second photomask. The first photomask includes a main circuit pattern. The second photomask includes a pad pattern, and the pad pattern includes a pad body pattern portion and an extension pattern portion. The extension pattern portion extends outward from the pad body pattern portion. When the first photomask and the second photomask overlap with each other, the extension pattern portion is at least partially surrounded by the main circuit pattern.
Claims10
A photomask module, comprising:
- a first photomask, comprising a main circuit pattern;
- and
- a second photomask, comprising a pad pattern, wherein the pad pattern comprises a pad body pattern portion and an extension pattern portion;
- the extension pattern portion extends outward from the pad body pattern portion;
- when the first photomask and the second photomask overlap with each other, the extension pattern portion is at least partially surrounded by the main circuit pattern.
2 more elements
A photomask pattern transfer method, comprising:
- providing a photomask module, comprising:
- a first photomask, comprising a main circuit pattern;
- and
- a second photomask, comprising a pad pattern, wherein the pad pattern comprises a pad body pattern portion and an extension pattern portion;
- the extension pattern portion extends outward from the pad body pattern portion;
- when the first photomask and the second photomask overlap with each other, the extension pattern portion is at least partially surrounded by the main circuit pattern;
- performing a first exposure and development process to transfer the main circuit pattern into a positive photoresist through a negative tone development (NTD) technology;
- and
- performing a second exposure and development process to transfer the pad pattern into the positive photoresist.
6 more elements
Dependencies are inferred from the claim text.